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WebMilton Ohring, in Materials Science of Thin Films (Second Edition), 2002. 8.3.3.2 Stacking Faults. Stacking faults are crystallographic defects in which the proper order of stacking planes is interrupted. For example, consider the first three atomic planes or layers of a (111) silicon film. Each of these planes may be imagined to be a close-packed array of atomic … WebNov 5, 1999 · Engineering Measurements – Methods and Intrinsic Errors provides a valuable insight into the equipment and methods generally used in taking measurements, and helps engineers avoid or minimize the inaccuracies that can arise even when using … WebApr 3, 2024 · Systematic Errors. Instrumental Errors; Environmental Errors; Observational Errors Theoretical Errors; Random Errors. 1) Gross Errors. Gross errors are caused by mistake in using instruments or … ruby oliver